Dr. Lee Meng Chuan

Lee Meng Chuan graduated in 2006 with a Bachelor of Engineering (Hons.) Electronics majoring in Computer. He obtained both his Master of Engineering degree in Microelectronics in 2012, and his Ph.D. in 2015 at MMU.

During the 2015 convocation, He was awarded the Best Ph.D. Engineering Thesis. In the same year, his contribution in the semiconductor engineering field earned him an award as the Senior Member of Institute of Electrical and Electronics Engineers (SMIEEE). Dr. Lee is now a Quality and Reliability Engineer at Intel. He is responsible for developing new reliability stresses for new products, as part of Design for Reliability road map.